| 摘要 |
An apparatus and computer program product for driving values to "don't care" (DC) adjusted/untimed nets of an integrated circuit design to thereby identify timing problems are provided. The apparatus and computer program product may be utilized, for example, with logical built-in self test (LBIST) testing of an integrated circuit in which the DC adjusted (dcadj) nets for normal functional mode of the integrated circuit may not be DC adjusted for LBIST mode. By using the apparatus and computer program product, timing related problems associated with DC adjusted/untimed nets can be made apparent either by using simulation or semi-formal/formal analysis. For example, with regard to DC adjusted/untimed nets, the apparatus and computer program product may identify any violations of these nets with regard to maintaining their DC adjusted values. Such identification of violations of DC adjusted/untimed nets may be made without interfering with the static timing analysis of timed nets.
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