发明名称 |
FAILURE INVESTIGATION MATERIAL COLLECTION SYSTEM |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a failure investigation material collection system allowing efficient easy and certain collection of failure material for investigating failure having occurred in an information processor of a failure investigation target. <P>SOLUTION: This failure investigation material collection system for investigating the failure having occurred in the material collection target device 10 and collecting the failure investigation material has: a material collection agent 11 installed to the material collection target device 10 to collect the material; and a console device 20 having a failure investigation material acquisition definition file 22 defining the failure investigation material necessary for the failure investigation. The material collection agent 11 receives the failure investigation material acquisition definition file 22 from a material collection console 21 inside the console device 20, and collects the failure investigation material from the material collection target device 10 based on the received definition file 22, and the console device 20 acquires the failure investigation material 12 collected by the material collection agent 11. <P>COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2009110060(A) |
申请公布日期 |
2009.05.21 |
申请号 |
JP20070278768 |
申请日期 |
2007.10.26 |
申请人 |
HITACHI ELECTRONICS SERVICE CO LTD |
发明人 |
KIMURA TOSHIRO;FUKUHARA YOICHI;ASO HIROKI;KAWASHIMA TAKAHIRO |
分类号 |
G06F11/34;G06F11/30;G06Q50/00;G06Q50/10 |
主分类号 |
G06F11/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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