| 摘要 |
An exemplary testing system for measuring an electronic device includes a main controller for generating a control signal, a signal generator for outputting a predetermined test input signal according to the control signals, an instrument unit comprising a plurality of instruments, and a testing port comprising a plurality of probes. The probes are configured for connecting corresponding testing points of the electronic device to the signal generator and the instruments. The predetermined test input signal is transmitted to the electronic device via the testing port, the instrument unit processing a test result signals outputted by the electronic device and outputting a result data, and the main controller receiving the result data and computing whether the result data is within a predetermined range. A related testing method is also provided.
|
