发明名称 DRIVER CIRCUIT AND TEST APPARATUS
摘要 Provided is a driver circuit that includes a first operational mode and a second operational mode and outputs an output signal according to an input signal, including a first driver section that, in the first operational mode, generates and outputs the output signal according to the input signal and, in the second operational mode, outputs a power supply power having a predetermined voltage and a second driver section that, in the first operational mode, receives the output signal output by the first driver section and outputs the received signal to the outside and, in the second operational mode, generates the output signal according to the input signal and outputs the thus generated signal to the outside. The second driver section includes a first transistor that, in the second operational mode, generates the output signal by operating according to the input signal and receives the power supply power from the first driver section and a second transistor that, in the second operational mode, operates differentially with respect to the first transistor and receives the power supply power from the first driver section commonly with the first transistor.
申请公布号 US2009128181(A1) 申请公布日期 2009.05.21
申请号 US20070941083 申请日期 2007.11.16
申请人 ADVANTEST CORPORATION 发明人 KAMO KENSUKE;SEKINO TAKASHI;AWAJI TOSHIAKI
分类号 G01R1/02 主分类号 G01R1/02
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