发明名称 METHOD AND DEVICE OF LOW-ENERGY ELECTRON ACCELERATION ETCHING AND CLEANING OF SUBSTRATE
摘要 <P>PROBLEM TO BE SOLVED: To provide a method of low-damage, anisotropic etching and cleaning of a substrate including a step of mounting the substrate upon a mechanical support part arranged within a positive column of a plasma discharge generated by either an ac or dc plasma reactor. <P>SOLUTION: The mechanical support part 12 is independent of the plasma reactor and capable of being electrically biased. The substrate is subjected to the positive column 15 of a plasma of low-energy electrons, that is, an electrical neutral part and a species reactive with the substrate. An additional structure 14 capable of being electrically biased can be arranged within the plasma to further adjust the extraction or retardation of particles from the plasma. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009111378(A) 申请公布日期 2009.05.21
申请号 JP20080266414 申请日期 2008.10.15
申请人 GEORGIA TECH RESEARCH CORP 发明人 MARTIN KEVIN P;GILLIS HARRY P;CHOUTOV DIMITRI A
分类号 H01L21/3065;C23F4/00;H01L21/027;H05H1/24;H05H1/46 主分类号 H01L21/3065
代理机构 代理人
主权项
地址