发明名称 |
Resist composition, method of forming resist pattern, novel compound, and acid generator |
摘要 |
A compound represented by general formula (I); and a compound represented by general formula (b1-1)
.[Chemical Formula 1]
€ƒ€ƒ€ƒ€ƒ€ƒ€ƒ€ƒ€ƒ X-Q 1 -Y 1 -SO - 3 M + €ƒ€ƒ€ƒ€ƒ€ƒ(1)
€ƒ€ƒ€ƒ€ƒ€ƒ€ƒ€ƒ€ƒ X-Q 1 -Y 1 -SO - 3 A + €ƒ€ƒ€ƒ€ƒ€ƒ(b1 - 1)
wherein Q 1 represents a divalent linkage group or a single bond; Y 1 represents an alkylene group which may have a substituent or a fluorinated alkylene group which may have a substituent; X represents a cyclic group of 3 to 30 carbon atoms which may have a substituent, and has an -SO 2 - bond in the structure thereof; M + represents an alkali metal ion; and A + represents an organic cation. |
申请公布号 |
EP2060600(A1) |
申请公布日期 |
2009.05.20 |
申请号 |
EP20080168403 |
申请日期 |
2008.11.05 |
申请人 |
TOKYO OHKA KOGYO CO., LTD. |
发明人 |
SESHIMO, TAKEHIRO;UTSUMI, YOSHIYUKI;KAWAUE, AKIYA;HADA, HIDEO;SHIMIZU, HIROAKI;NAKAMURA, TSUYOSHI |
分类号 |
C08K5/41;C07D333/50;G03F7/004 |
主分类号 |
C08K5/41 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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