发明名称 Resist composition, method of forming resist pattern, novel compound, and acid generator
摘要 A compound represented by general formula (I); and a compound represented by general formula (b1-1) .[Chemical Formula 1] €ƒ€ƒ€ƒ€ƒ€ƒ€ƒ€ƒ€ƒ X-Q 1 -Y 1 -SO - 3 M + €ƒ€ƒ€ƒ€ƒ€ƒ(1) €ƒ€ƒ€ƒ€ƒ€ƒ€ƒ€ƒ€ƒ X-Q 1 -Y 1 -SO - 3 A + €ƒ€ƒ€ƒ€ƒ€ƒ(b1 - 1) wherein Q 1 represents a divalent linkage group or a single bond; Y 1 represents an alkylene group which may have a substituent or a fluorinated alkylene group which may have a substituent; X represents a cyclic group of 3 to 30 carbon atoms which may have a substituent, and has an -SO 2 - bond in the structure thereof; M + represents an alkali metal ion; and A + represents an organic cation.
申请公布号 EP2060600(A1) 申请公布日期 2009.05.20
申请号 EP20080168403 申请日期 2008.11.05
申请人 TOKYO OHKA KOGYO CO., LTD. 发明人 SESHIMO, TAKEHIRO;UTSUMI, YOSHIYUKI;KAWAUE, AKIYA;HADA, HIDEO;SHIMIZU, HIROAKI;NAKAMURA, TSUYOSHI
分类号 C08K5/41;C07D333/50;G03F7/004 主分类号 C08K5/41
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