发明名称 METHOD OF MAKING A SEMICONDUCTOR DEVICE USING TREATED PHOTORESIST
摘要 <p>Photoresist, which contains hydrogen, is patterned over a semiconductor substrate then treated with either a molecular halogen or a liquid fluorinating agent in order to improve subsequent ion implantation. Hydrogen is replaced, to whatever extent is found desirable, with the halogen. Molecular fluorine (F<SUB>2</SUB>) has been found to be particularly effective as the molecular halogen. Molecular fluorine (F<SUB>2</SUB>) reacts very efficiently in replacing the hydrogen and further has the benefit of continuing to penetrate into the patterned photoresist so that the entire patterned photoresist layer can have the hydrogen atoms replaced with fluorine atoms if the molecular fluorine flow is continued long enough. The resulting treated photoresist is much more resistant to penetration by implanted ions so that the photoresist can be deposited to a lesser thickness. This is beneficial in shadowing problems such as can occur in halo implants and where the patterned photoresist has a high aspect ratio.</p>
申请公布号 EP1719162(A4) 申请公布日期 2009.05.20
申请号 EP20050711379 申请日期 2005.01.12
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 GARZA, CESAR, M.;DARLINGTON, WILLIAM, D.;FILIPIAK, STANLEY, M.;VASEK, JAMES, E.
分类号 H01L21/027;H01L21/28;H01L21/3213;H01L21/336;H01L29/78 主分类号 H01L21/027
代理机构 代理人
主权项
地址