发明名称 Devices and methods to improve erase uniformity and to screen for marginal cells for NROM memories
摘要 A NROM memory device includes an array of memory cells and first and second bit lines. The first and second bit lines are coupled to opposite sides of the memory cells. During an erase operation, one of the sides of the memory cells receives a positive voltage and the other side couples to a common node or a limited current source. Methods are also disclosed that can easily screen for marginal memory cells based on a threshold voltage distribution of the memory cells.
申请公布号 US7535771(B2) 申请公布日期 2009.05.19
申请号 US20050096878 申请日期 2005.04.01
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 HSIEH WEN-YI;LIN CHING-CHUNG;CHEN KEN-HUI;HUNG CHUN-HSIUNG
分类号 G11C16/04 主分类号 G11C16/04
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