发明名称 Calculation of ADC and DAC errors in LSI chip
摘要 A semiconductor integrated circuit includes a bus, a CPU connected to the bus, a DAC having a digital input thereof connected to the bus, an ADC having a digital output thereof connected to the bus, a voltage generating circuit, a first switch configured to cause an electrical coupling between an analog input of the ADC and the voltage generating circuit to switch between a conductive state and a nonconductive state, and a second switch configured to cause an electrical coupling between an analog output of the DAC and the analog input of the ADC to switch between a conductive state and a nonconductive state.
申请公布号 US7535388(B2) 申请公布日期 2009.05.19
申请号 US20070892356 申请日期 2007.08.22
申请人 FUJITSU MICROELECTRONICS LIMITED 发明人 MIHO AKIRA
分类号 H03M1/06 主分类号 H03M1/06
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