发明名称 Thin-film capacitor with a field modification layer and methods for forming the same
摘要 A method for forming a capacitor includes providing a metal-containing bottom electrode, forming a capacitor insulator over the metal-containing bottom electrode, forming a metal-containing top electrode over the capacitor insulator, and forming a dielectric-containing field modification layer over the capacitor insulator and at least partially surrounding the metal-containing top electrode. Forming the dielectric-containing field modification layer may include oxidizing a sidewall of the metal-containing field modification layer. A barrier layer may be formed over the capacitor insulator prior to forming the metal-containing top electrode.
申请公布号 US7534693(B2) 申请公布日期 2009.05.19
申请号 US20060326524 申请日期 2006.01.04
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 ROBERTS DOUGLAS R.;LUCKOWSKI ERIC D.;RAUF SHAHID;VENTZEK PETER L. G.
分类号 H01L21/20 主分类号 H01L21/20
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