发明名称 Method of determination of resolution of scanning electron microscope
摘要 A method of determining a resolution of a scanning electron microscope includes using an image of an object provided by the scanning electron microscope during scanning of an object of measurement, obtaining information about a resolution of the scanning electron microscope from the image of the object during its scanning by the scanning electron microscope; and using the information for determining the resolution of the scanning electron microscope.
申请公布号 US2009121131(A1) 申请公布日期 2009.05.14
申请号 US20070983622 申请日期 2007.11.13
申请人 NIKITIN ARKADY 发明人 NIKITIN ARKADY
分类号 G01N23/00 主分类号 G01N23/00
代理机构 代理人
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