发明名称 DLL CIRCUIT AND SEMICONDUCTOR DEVICE PROVIDED WITH THE SAME, AND DATA PROCESSING SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To provide a DLL circuit which reduces the risk of pulse loss even if a clock frequency is high. <P>SOLUTION: The DLL circuit 100 has a phase determination circuit 111 which compares phases of respective rising edges of CK and LCLK to generate a determination signal R-U/D, a phase determination circuit 112 which compares phases of falling edges of CK and LCLK to generate a determination signal F-U/D, a first adjustment circuit which adjusts the position of an LCLKR active edge based on the determination signal R-U/D, a second adjustment circuit which adjusts the position of an LCLKF active edge based on the determination signal F-U/D, a clock generation circuit which generates the LCLK based on the LCLKR and the LCLKF, a stop circuit 150 which stops adjustment operations of the second adjustment circuit responding to that an adjustment direction of the LCLKR active edge is reverse to that of the LCLKF active edge. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009105657(A) 申请公布日期 2009.05.14
申请号 JP20070275470 申请日期 2007.10.23
申请人 ELPIDA MEMORY INC 发明人 ABE TSUNEO
分类号 H03L7/081;G11C11/4076;H03K5/14 主分类号 H03L7/081
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