发明名称 SEMICONDUCTOR SUBSTRATE AND METHOD OF MANUFACTURING THE SAME, AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To reduce a defect (for instance, displacement) of a metamorphic substrate growing an InP-based semiconductor device by using a compression strain layer and a tensile strain layer. SOLUTION: This semiconductor substrate includes: a gallium arsenide substrate 100; a buffer layer 101 formed on the gallium arsenide substrate 100; and a strain compensation structure layer 105 formed by stacking, on the buffer layer 101, the tensile strain layer 105a formed of a material having a small lattice constant in an in-plane direction relative to that of the buffer layer 101, and the compression strain layer 105b formed of a material having a large lattice constant in an in-plane direction relative to that of the buffer layer 101. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009105231(A) 申请公布日期 2009.05.14
申请号 JP20070275880 申请日期 2007.10.24
申请人 SONY CORP 发明人 SUZUKI NOBUHIRO;TANIGUCHI OSAMU
分类号 H01L21/20;C23C16/30;C30B25/18;C30B29/40;H01L21/205;H01L21/331;H01L29/737 主分类号 H01L21/20
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