发明名称 TMR device with low magnetostriction free layer
摘要 A high performance TMR sensor is fabricated by employing a free layer comprised of CoBX with a lambda between -5x10-6 and 0 on a MgOX tunnel barrier. Optionally, a FeCo/CoBX free layer configuration may be used where x is about 1 to 30 atomic %. Trilayer configurations represented by FeCo/CoFeB/CoBX, FeCo/CoBX/CoFeB, FeCoY/CoFeW/CoBX, or FeCoY/FeB/CoBX may also be employed. Alternatively, CoNiFeB or CoNiFeBM formed by co-sputtering CoB with CoNiFe or CoNiFeM, respectively, where M is V, Ti, Zr, Nb, Hf, Ta, or Mo may be substituted for CoBx in the aforementioned embodiments. A 15 to 30% in improvement in TMR ratio over a conventional CoFe/NiFe free layer is achieved while maintaining a low Hc and RA<3 ohm-um2. In bilayer or trilayer embodiments, lambda between -5x10-6 and 5x10-6 is achieved by combining CoBx (-lambda) and one or more layers having a positive lambda.
申请公布号 US2009122450(A1) 申请公布日期 2009.05.14
申请号 US20070983329 申请日期 2007.11.08
申请人 HEADWAY TECHNOLOGIES, INC. 发明人 WANG HUI-CHUAN;ZHAO TONG;LI MIN;ZHANG KUNLIANG
分类号 G11B5/33 主分类号 G11B5/33
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