发明名称 Techniques to Improve Characteristics of Processed Semiconductor Substrates
摘要 Techniques to improve characteristics of processed semiconductor substrates are described, including cleaning a substrate using a preclean process, the substrate comprising a dielectric region and a conductive region, introducing a hydroquinone to the substrate after cleaning the substrate using the preclean operation, and forming a capping layer over the conductive region of the substrate after introducing the hydroquinone.
申请公布号 US2009124081(A1) 申请公布日期 2009.05.14
申请号 US20080268387 申请日期 2008.11.10
申请人 DUONG ANH NGOC;LANG CHI-I 发明人 DUONG ANH NGOC;LANG CHI-I
分类号 H01L21/3205 主分类号 H01L21/3205
代理机构 代理人
主权项
地址