发明名称 TEMPERATURE MEASUREMENT IN A SUBSTRATE PROCESSING APPARATUS
摘要 A substrate processing apparatus is configured to provide in series a plurality of processing blocks, each block including a processing unit and a transport robot transporting a substrate. A substrate rest is provided in a connecting portion of adjacent processing blocks. A sensor plate with sensor coils is provided spanning over support pins of the substrate rest. Once a temperature-measurement substrate with temperature-measuring elements, each element formed by connecting a coil to a quartz resonator, is placed on the support pins, a transmitter-receiver transmits transmission waves corresponding to the characteristic frequencies of the quartz resonators to the temperature-measuring elements through the sensor coils. After the stop of the transmission, the transmitter-receiver receives electromagnetic waves from the temperature-measuring elements through the sensor coils, and the temperature computer computes the substrate temperature based on the frequencies of the electromagnetic waves.
申请公布号 US2009120362(A1) 申请公布日期 2009.05.14
申请号 US20080267267 申请日期 2008.11.07
申请人 SOKUDO CO., LTD. 发明人 HAMADA TETSUYA
分类号 B05C11/00 主分类号 B05C11/00
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