HIGH-SPEED SERIAL DATA RECEIVING DEVICE, TEST METHOD, AND SEMICONDUCTOR INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To provide a high-speed serial data receiving device capable of determination of Pass or Fail by setting an ACSpec conformed to specifications requested by users when testing input AC characteristics of the high-speed serial data receiving device, and to provide a test method and a semiconductor integrated circuit. SOLUTION: The high-speed serial data receiving device 100 inputs serial data and a clock signal and converts the serial data into parallel data by being synchronized with a strobe signal. The high-speed serial data receiving device includes: PLL 107 provided with a signal generation means for creating a plurality of the clock signals different in phases based on the clock signal; a convertor 106 for being converted into the parallel data by sampling the serial data by the clock signal; a circuit 109 for selecting an ACSpec value of a serial input signal; and a resolution selection circuit 110 for determining Spec resolution. AC characteristics can be inspected without controlling phase relationship of normal serial data and a clock. COPYRIGHT: (C)2009,JPO&INPIT