发明名称 WIRING PATTERN TREATMENT APPARATUS
摘要 PROBLEM TO BE SOLVED: To detect with high precision defects in a wiring pattern formed on a wiring board. SOLUTION: A wiring pattern display apparatus irradiates the wiring board 1 with light and displays the wiring pattern 2 formed on the wiring board 1 by means of the reflected light of the light. The apparatus comprises: a plurality of irradiation means for generating a plurality of lights having different wavelengths and irradiating the wiring board 1 with the lights from a plurality of different directions; a wavelength separation means for separating the wavelengths of the reflected lights of the lights irradiated on the wiring pattern 2 from the irradiation means; and a display section for displaying the wiring pattern 2 in accordance with the light with the wavelength separated by the wavelength separation means. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009103512(A) 申请公布日期 2009.05.14
申请号 JP20070274010 申请日期 2007.10.22
申请人 HITACHI LTD 发明人 IIDA TADASHI;SHIOAKI RYOSHI
分类号 G01B11/24;G01B11/30;G01N21/956;H05K3/00 主分类号 G01B11/24
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