发明名称 |
WIRING PATTERN TREATMENT APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To detect with high precision defects in a wiring pattern formed on a wiring board. SOLUTION: A wiring pattern display apparatus irradiates the wiring board 1 with light and displays the wiring pattern 2 formed on the wiring board 1 by means of the reflected light of the light. The apparatus comprises: a plurality of irradiation means for generating a plurality of lights having different wavelengths and irradiating the wiring board 1 with the lights from a plurality of different directions; a wavelength separation means for separating the wavelengths of the reflected lights of the lights irradiated on the wiring pattern 2 from the irradiation means; and a display section for displaying the wiring pattern 2 in accordance with the light with the wavelength separated by the wavelength separation means. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2009103512(A) |
申请公布日期 |
2009.05.14 |
申请号 |
JP20070274010 |
申请日期 |
2007.10.22 |
申请人 |
HITACHI LTD |
发明人 |
IIDA TADASHI;SHIOAKI RYOSHI |
分类号 |
G01B11/24;G01B11/30;G01N21/956;H05K3/00 |
主分类号 |
G01B11/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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