发明名称 METHOD OF FORMING IRON SILICIDE
摘要 PROBLEM TO BE SOLVED: To form single-phase iron silicide by a simple method. SOLUTION: A silicon oxide layer 102 is formed on a silicon substrate (silicon layer) 101 to a thickness of, for example, 1.8 nm. Then an iron layer 103 having a predetermined film thickness is formed on the silicon oxide layer 102. Thus the iron layer 103 is formed on the silicon substrate 101 with the silicon oxide layer 102 interposed therebetween, and then they are heated under predetermined temperature conditions to form silicide by subjecting iron of the iron layer 103 and silicon of the silicon substrate 101 to reaction through the silicon oxide layer 102, thereby forming an iron silicide layer 104 composed of single-phase (αphase) FeSi<SB>2</SB>(α-FeSi<SB>2</SB>) on the silicon substrate 101. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009105187(A) 申请公布日期 2009.05.14
申请号 JP20070274844 申请日期 2007.10.23
申请人 NIPPON TELEGR & TELEPH CORP <NTT> 发明人 MAEDA FUMIHIKO;HIBINO HIROKI;SUZUKI SATORU
分类号 H01L21/20 主分类号 H01L21/20
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