发明名称 Method of forming a semiconductor device
摘要 The present invention is related to a method for forming a high-k gate dielectric, comprising the steps of: - providing a semiconductor substrate, - cleaning the substrate, - performing a thermal treatment , - performing a high-k dielectric material deposition, characterised in that said thermal treatment step is performed in a non-oxidizing ambient, leading to the formation of a thin interfacial layer.
申请公布号 EP2058844(A1) 申请公布日期 2009.05.13
申请号 EP20070119632 申请日期 2007.10.30
申请人 IMEC;TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.;KATHOLIEKE UNIVERSITEIT LEUVEN, K.U. LEUVEN R&D 发明人 QUYANG, HUI;EVERAERT, JEAN-LUC;NYNS, LAURA;VOS, RITA
分类号 H01L21/02;H01L21/3105;H01L21/314;H01L21/316 主分类号 H01L21/02
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