METHOD FOR FORMING TEST PATTERN OF GATE OX INTEGRITY AND TEST PATTERN STRUCTURE FOR THE GATE OX INTEGRITY,申请号KR20070098735-传众专利搜索

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发明名称	METHOD FOR FORMING TEST PATTERN OF GATE OX INTEGRITY AND TEST PATTERN STRUCTURE FOR THE GATE OX INTEGRITY
摘要
申请公布号	KR100896842(B1)	申请公布日期	2009.05.12
申请号	KR20070098735	申请日期	2007.10.01
申请人		发明人
分类号	H01L23/544	主分类号	H01L23/544
代理机构		代理人
主权项
地址

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