发明名称 Inspection device for inspecting thin plate container and method of inspecting thin plate container
摘要 An inspection device is used for inspecting a thin plate container having a stage guide with insulation property for supporting a thin plate one by one. The inspection device includes a conductive plate having an upper surface and a lower surface and supported on the stage guide; a shaft disposed above the upper surface or below the lower surface; and a contact member abutting against the conductive plate. The conductive plate, the shaft, and the contact member respectively have conductivity.
申请公布号 US7532004(B2) 申请公布日期 2009.05.12
申请号 US20070730994 申请日期 2007.04.05
申请人 OKI SEMICONDUCTOR CO., LTD. 发明人 YOSHINO KATSUHIRO
分类号 G01R31/28;G06F7/00 主分类号 G01R31/28
代理机构 代理人
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