| 摘要 |
The semiconductor test system comprises a test device for testing semiconductor devices including redundant circuits to obtain fail information of defective parts of the semiconductor devices; a redundant remedy judging device which includes fail memories for storing the fail information, and a redundant remedy judging unit for judging based on the fail information stored in the fail memories as to whether or not the redundant remedy replacing the defective parts of the semiconductor devices with the redundant circuits can be made, and which is provided independent of the test device, wherein the test device and the redundant remedy judging device are interconnected with each other via a network, and fail information is transmitted from the test device to the redundant remedy judging device.
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