发明名称 Semiconductor device and method of fabricating the same
摘要 A protective insulating film is deposited over first and second field-effect transistors formed on a semiconductor substrate. A capacitor composed of a capacitor lower electrode, a capacitor insulating film composed of an insulating metal oxide film, and a capacitor upper electrode is formed on the protective insulating film. A first contact plug formed in the protective insulating film provides a direct connection between the capacitor lower electrode and an impurity diffusion layer of the first field-effect transistor. A second contact plug formed in the protective insulating film provides a direct connection between the capacitor upper electrode and an impurity diffusion layer of the second field-effect transistor.
申请公布号 US7531863(B2) 申请公布日期 2009.05.12
申请号 US20050270615 申请日期 2005.11.10
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 NAGANO YOSHIHISA;UEMOTO YASUHIRO
分类号 H01L21/768;H01L27/108;H01L21/8242;H01L21/8246;H01L23/522;H01L27/02;H01L27/10;H01L27/105 主分类号 H01L21/768
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