发明名称 Methods for reducing contamination of semiconductor devices and materials during wafer processing
摘要 Methods of processing a semiconductor structure including a metal layer in the presence of organic material include flowing an aqueous mixture including an oxidizing agent over the semiconductor structure during processing of the semiconductor structure. Processing the semiconductor structure may include sawing the semiconductor structure and/or scrubbing the semiconductor structure with pressurized water. The oxidizing agent may include a peroxide, such as hydrogen peroxide, or another oxidizing agent.
申请公布号 US7531431(B2) 申请公布日期 2009.05.12
申请号 US20060437934 申请日期 2006.05.19
申请人 CREE, INC. 发明人 RAYFIELD BARRY;FANELLI CHRIS;JACKSON MITCH
分类号 H01L21/00 主分类号 H01L21/00
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