发明名称 Semiconductor memory device having phase change memory cells arranged in a checker manner
摘要 A memory cell has a heater element which generates heat by supplying electric current, a chalcogenide layer whose phase is changed by applying heat, and two transistors for driving the heater element. Bit lines extend in a predetermined direction and electrically connect with memory cells. Word lines extend at right angles to bit lines and electrically connect with memory cells. In a first cell row, memory cells are arranged at interval 2d along the bit lines. In a second row, memory cells are arranged such that the first cell row is shifted by distance d along the bit lines. First cell rows and second cell rows are alternately arranged at an interval e along the direction of word line so as to arrange the memory cells in a checker manner.
申请公布号 US7532508(B2) 申请公布日期 2009.05.12
申请号 US20070623677 申请日期 2007.01.16
申请人 ELPIDA MEMORY, INC. 发明人 FUJI YUKIO
分类号 G11C11/00 主分类号 G11C11/00
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