| 摘要 |
Embodiments of a system and method for testing an integrated circuit module comprising multiple integrated circuit devices, such as a memory module comprising multiple memory devices for example, is disclosed. Embodiments of the method may be employed to test an integrated circuit device of the integrated circuit module that provides a data strobe signal associated with at least one data signal provided by the same integrated circuit device. A determination of a test outcome for the integrated circuit module may be made after identifying data valid windows for each integrated circuit device, without having to both identify a common sampling window defined by an intersection of the identified data valid windows and verify that such common sampling window meets specification requirements, as may be performed by conventional testers.
|
