| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor storage device detecting shortcircuiting between data bus lines. SOLUTION: The semiconductor storage device includes a memory cell array having a plurality of word lines, a plurality of bit lines, and memory cells arranged in positions where the word lines and the bit lines intersect each other, a plurality of data bus lines connected to the plurality of bit lines, and a plurality of sense amplifiers connected to the plurality of data bus lines to detect stored data based on current values of the data bus lines generated according to the stored data of the memory cells. Each data bus line is provided with a switching means. A test circuit sets all the switch means in a conductive state during a normal operation, and sets the switch means in conductive or non-conductive state according to test patterns during shortcircuit test. COPYRIGHT: (C)2009,JPO&INPIT
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