发明名称 METHODS OF POST CHEMICAL MECHANICAL POLISHING AND WAFER CLEANING USING AMIDOXIME COMPOSITIONS
摘要 <p>The invention relates to a method for the removal of residues and contaminants from metal or dielectric surfaces and to a method for chemical mechanical polishing of a copper or aluminum surface. The methods of the invention include using an aqueous amidoxime complex agent. Optionally, the pH of the solution can be adjusted with an acid or base. The method includes applying the above composition to the copper or aluminum surface and polishing the surface in the presence of the composition.</p>
申请公布号 WO2009058275(A1) 申请公布日期 2009.05.07
申请号 WO2008US12238 申请日期 2008.10.29
申请人 EKC TECHNOLOGY, INC.;LEE, WAI, MUN 发明人 LEE, WAI, MUN
分类号 C11D3/32;C11D7/32;C11D11/00;H01L21/306 主分类号 C11D3/32
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