发明名称 |
METHODS OF POST CHEMICAL MECHANICAL POLISHING AND WAFER CLEANING USING AMIDOXIME COMPOSITIONS |
摘要 |
<p>The invention relates to a method for the removal of residues and contaminants from metal or dielectric surfaces and to a method for chemical mechanical polishing of a copper or aluminum surface. The methods of the invention include using an aqueous amidoxime complex agent. Optionally, the pH of the solution can be adjusted with an acid or base. The method includes applying the above composition to the copper or aluminum surface and polishing the surface in the presence of the composition.</p> |
申请公布号 |
WO2009058275(A1) |
申请公布日期 |
2009.05.07 |
申请号 |
WO2008US12238 |
申请日期 |
2008.10.29 |
申请人 |
EKC TECHNOLOGY, INC.;LEE, WAI, MUN |
发明人 |
LEE, WAI, MUN |
分类号 |
C11D3/32;C11D7/32;C11D11/00;H01L21/306 |
主分类号 |
C11D3/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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