发明名称 CMP PAD AND METHOD FOR MANUFACTURING THE SAME
摘要 Embodiments relate to a chemical mechanical polishing (CMP) pad. According to embodiments, a CMP pad may include a pad body having a series of concave and convex patterns and a chemical reactant formed on and/or over the pad body. The CMP pad may uniformly perform a CMP process without using abrasive grains. Accordingly, scratches on a surface of a wafer may be prevented.
申请公布号 US2009117837(A1) 申请公布日期 2009.05.07
申请号 US20080265853 申请日期 2008.11.06
申请人 CHOI JAE-YOUNG 发明人 CHOI JAE-YOUNG
分类号 B24D3/28;B24D3/34;B24D11/00;B24D18/00;B29C35/08;B29C43/04 主分类号 B24D3/28
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