| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit capable of preventing destruction of a circuit (for example, an analog circuit), having a low allowable operation frequency in scan test. SOLUTION: When a scan test mode signal is "1", each output signal from the first AND circuit 11 and the second AND circuit 12 is fixed at a low level, and an output signal from an OR circuit 13 is fixed at a high level. Consequently, it is so set that each output signal from the fourth flip-flop FF4 to the sixth flip-flop FF6 is not transferred to the first to third analog circuits 21-23, in the scan test; whereas each output signal rom the fourth flip-flop FF4 to the sixth flip-flop FF6 propagates to the first to third analog circuits 21-23 during normal operation. COPYRIGHT: (C)2009,JPO&INPIT
|
