METHOD AND APPARATUS FOR ARRAY-BASED ELECTRICAL DEVICE CHARACTERIZATION

摘要

An electronic circuit (300) to determine current-voltage characteristics of a plurality of electronic devices under test (305). The electronic circuit (300) is comprised of a plurality of individual test cells, each of the plurality of test cells is configured to electrically couple to a first terminal of one of the plurality of electronic devices under test (305) and to a first current source (311). A second terminal of each of the plurality of electronic devices under test (305) couples to a second current source (313). The circuit (300) employs a current-based measurement method.