发明名称 FEATURE VALUE CANDIDATE GENERATING DEVICE AND FEATURE VALUE CANDIDATE GENERATING METHOD
摘要 <p>A feature value candidate generating device comprises storage means storing feature values of plural types extracted from samples, index value calculating means for calculating the index values obtained by normalizing the number of feature values with the number of samples for each feature value, an evaluation subject selecting means for selecting a combination of feature values to be evaluated from the feature values of the plural types, evaluating means for evaluating the combination of the selected feature values as evaluation subjects by judging whether or not the uniformity of the frequency distribution of the index values of the feature values meets a predetermined criterion, and candidate determining means for determining the combination of the feature values evaluated as meeting the predetermined criterion as feature value candidates given to a model making device.</p>
申请公布号 WO2009057778(A1) 申请公布日期 2009.05.07
申请号 WO2008JP69951 申请日期 2008.10.31
申请人 OMRON CORPORATION;YONEDA, MITSUHIRO;NAKAJIMA, HIROSHI;TSUCHIYA, NAOKI;TASAKI, HIROSHI 发明人 YONEDA, MITSUHIRO;NAKAJIMA, HIROSHI;TSUCHIYA, NAOKI;TASAKI, HIROSHI
分类号 A61B5/05;G06N99/00 主分类号 A61B5/05
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