发明名称 METHOD FOR FORMING SELF-ALIGNED CONTACTS AND LOCAL INTERCONNECTS SIMULTANEOUSLY
摘要 The present invention relates generally to semiconductors, and more specifically to semiconductor memory device structures and an improved fabrication process for making the same. The improved fabrication process allows the self-aligned contacts and local interconnects to the processed simultaneously. The process allows the minimal distance requirement between the self-aligned contacts and the local interconnects to be widened, which makes the patterning of self-aligned contacts and local interconnects easier. The widened minimal distance requirement also allows further memory cell shrinkage. The improved structures of self-aligned contacts and local interconnects also have excellent isolation characteristic.
申请公布号 US2009114973(A1) 申请公布日期 2009.05.07
申请号 US20080113855 申请日期 2008.05.01
申请人 LUOH TUUNG;YANG LING-WUU;CHEN KUANG-CHAO 发明人 LUOH TUUNG;YANG LING-WUU;CHEN KUANG-CHAO
分类号 H01L29/788;H01L23/52 主分类号 H01L29/788
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