发明名称 NON-VOLATILE MEMORY DEVICE HAVING CHARGE TRAPPING LAYER AND METHOD OF FABRICATING THE SAME
摘要 <p>Disclosed herein are a non-volatile memory device and a method of manufacturing the same. The non-volatile memory device includes a substrate, a tunneling layer disposed on the substrate, a charge trapping layer disposed on the tunneling layer, a blocking layer disposed on the charge trapping layer, and a control gate electrode disposed on the blocking layer. The blocking layer in contact with the charge trapping layer includes an aluminum nitride layer.</p>
申请公布号 KR20090044398(A) 申请公布日期 2009.05.07
申请号 KR20070110484 申请日期 2007.10.31
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JOO, MOON SIG;PARK, KI SEON;KIM, YONG TOP;PARK, JAE YOUNG;LEE, KI HONG
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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