| 摘要 |
PROBLEM TO BE SOLVED: To provide a testing device of DUT having a bidirectional differential interface. SOLUTION: A main driver amplifier AMP0 generates a first differential signal Vd based on pattern data PAT to be transmitted to DUT 102. A first replica driver amplifier AMP1 generates a second differential signal Vcp based on the pattern data PAT. A second replica driver amplifier AMP2 generates a third differential signal Vcn based on the pattern data PAT. A first comparator CMP1 compares voltages of a node N1 and a node N2, and a second comparator CMP2 compares voltages of a node N3 and a node N4. COPYRIGHT: (C)2009,JPO&INPIT
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