发明名称 CONTROLLER FOR OPTICAL DEVICE, EXPOSURE METHOD AND APPARATUS, AND METHOD FOR MANUFACTURING DEVICE
摘要 An exposure method for exposing a mask pattern, which includes plural types of patterns, with a high throughput and optimal illumination conditions for each type of pattern. The method includes guiding light from a first spatial light modulator illuminated with pulse lights of illumination light to a second spatial light modulator and exposing a wafer with light from the second spatial light modulator, accompanied by: controlling a conversion state of the second spatial light modulator including a plurality of second mirror elements; and controlling a conversion state of the first spatial light modulator including a plurality of first mirror elements to control intensity distribution of the illumination light on a predetermined plane between the first spatial light modulator and the second spatial light modulator.
申请公布号 US2009117494(A1) 申请公布日期 2009.05.07
申请号 US20080266367 申请日期 2008.11.06
申请人 NIKON CORPORATION 发明人 OWA SOICHI
分类号 G03F7/20;G03B27/42;G03B27/54 主分类号 G03F7/20
代理机构 代理人
主权项
地址