发明名称 TRENCH GATE MOSFET AND METHOD OF MANUFACTURING THE SAME
摘要 <p>A Trench gate MOS field-effect transistor having a narrow, lightly doped, region extending from a channel accomodating region (3) of same conductivity type immediately adjacent the trench sidewall. The narrow region may be self-aligned to the top of a lower polysilicon shield region in the trench or may extend the complete depth of the trench. The narrow region advantageously relaxes the manufacturing tolerances, which otherwise require close alignment of the upper polysilicon trench gate to the body-drain junction.</p>
申请公布号 WO2009057015(A1) 申请公布日期 2009.05.07
申请号 WO2008IB54355 申请日期 2008.10.22
申请人 NXP B.V.;PEAKE, STEVEN, THOMAS;RUTTER, PHILIP;ROGERS, CHRISTOPHER;DROBNIS, MIRON;BUTLER, ANDREW 发明人 PEAKE, STEVEN, THOMAS;RUTTER, PHILIP;ROGERS, CHRISTOPHER;DROBNIS, MIRON;BUTLER, ANDREW
分类号 H01L29/78;H01L21/225;H01L21/265;H01L21/336;H01L29/10;H01L29/40;H01L29/423 主分类号 H01L29/78
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