发明名称 Fault management apparatus
摘要 <p>A fault management apparatus that enables calculation of evaluation values relating to a fault occurring to a management target as objective values without involvement of human judgment is provided. Fault information containing fault content information showing content of a fault occurring to a process in a production line, and detection status information and action content information associated with the fault is stored in a fault occurrence history storage part as a fault occurrence history. A fault extraction part reads the fault occurrence history from the fault occurrence history storage part to extract fault information containing specific fault content information. An influence degree calculation part calculates a degree of influence showing the degree of influence caused by a specific fault by performing statistical processing based on detection status information and action content information contained in the fault information extracted by the fault extraction part.</p>
申请公布号 EP1845429(A3) 申请公布日期 2009.05.06
申请号 EP20070007434 申请日期 2007.04.11
申请人 OMRON CORPORATION 发明人 MORIYA, TOSHIHI;NAKAJIMA, AKIRA
分类号 G05B19/418;G05B23/02;G06Q50/00;G06Q50/04 主分类号 G05B19/418
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