Apparatus for measuring specular reflectance of a sample

摘要

An accessory for a spectrometer for carrying out measurements of specular reflectance of a sample. The accessory is designed so that all components can be located in a housing and the sample can be located horizontally on a top-plate of the housing with the components disposed below the plane of that plate. The radiation can be arranged to be incident at a number of different angles on the sample and it can also be arranged that the radiation is directed to the detector without being incident on the sample.