发明名称 |
Semiconductor silicon single crystal growth method having improvement in oxygen concentration characteristics |
摘要 |
<p>The present invention relates to a semiconductor single crystal growth method, which uses a Czochralski process for growing a semiconductor single crystal (1) through a solid-liquid interface by dipping a seed into a semiconductor melt received in a quartz crucible (10) and pulling up the seed while rotating the quartz crucible (10) and applying a strong horizontal magnetic field, wherein the seed is pulled up while the quartz crucible (10) is rotated with a rate between 0.6 rpm and 1.5 rpm.</p> |
申请公布号 |
EP2055812(A1) |
申请公布日期 |
2009.05.06 |
申请号 |
EP20080018849 |
申请日期 |
2008.10.28 |
申请人 |
SILTRON INC. |
发明人 |
CHO, HYON-JONG;SHIN, SEUNG-HO;MOON, JI-HUN;LEE, HONG-WOO;HONG, YOUNG-HO |
分类号 |
C30B15/30;C30B29/06;C30B30/04 |
主分类号 |
C30B15/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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