发明名称 Semiconductor silicon single crystal growth method having improvement in oxygen concentration characteristics
摘要 <p>The present invention relates to a semiconductor single crystal growth method, which uses a Czochralski process for growing a semiconductor single crystal (1) through a solid-liquid interface by dipping a seed into a semiconductor melt received in a quartz crucible (10) and pulling up the seed while rotating the quartz crucible (10) and applying a strong horizontal magnetic field, wherein the seed is pulled up while the quartz crucible (10) is rotated with a rate between 0.6 rpm and 1.5 rpm.</p>
申请公布号 EP2055812(A1) 申请公布日期 2009.05.06
申请号 EP20080018849 申请日期 2008.10.28
申请人 SILTRON INC. 发明人 CHO, HYON-JONG;SHIN, SEUNG-HO;MOON, JI-HUN;LEE, HONG-WOO;HONG, YOUNG-HO
分类号 C30B15/30;C30B29/06;C30B30/04 主分类号 C30B15/30
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