发明名称 A test station for testing leakage current through the insulating package of power electronic components, and a corresponding method
摘要 A test station (6) for testing leakage current through the insulating package (42) of power electronic components (3), said test station comprising: first contact portions (36) for applying a first test voltage on one or more pins (40) of said tested components, second contact portions (24, 37, 370, 25, 26) for applying a second test voltage on several external faces of said insulating package of said tested components, characterized in that said second contact portions are arranged for contacting several mutually orthogonal faces of said power electronic components (3).
申请公布号 EP2056117(A1) 申请公布日期 2009.05.06
申请号 EP20070119668 申请日期 2007.10.30
申请人 ISMECA SEMICONDUCTOR HOLDING SA 发明人 CHARPIE, MICHEL;CRETENET, DAVY
分类号 G01R31/12;G01R31/02;G01R31/26;G01R31/28 主分类号 G01R31/12
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