发明名称 PACKAGING OF INTEGRATED CIRCUITS AND VERTICAL INTEGRATION
摘要 A first level packaging wafer is made of a semiconductor or insulating material. The bumps on the wafer are made using vertical integration technology, without solder or electroplating. More particularly, vias are etched part way into a first surface of the substrate. Metal is deposited into the vias. Then the substrate is blanket-etched from the back side until the metal is exposed and protrudes from the vias to form suitable bumps. Dicing methods and vertical integration methods are also provided. Solder or electroplating are used in some embodiments.
申请公布号 EP1247294(A4) 申请公布日期 2009.05.06
申请号 EP20000982464 申请日期 2000.12.06
申请人 TRU-SI TECHNOLOGIES, INC. 发明人 SINIAGUINE, OLEG;SAVASTIOUK, SERGEY
分类号 H01L21/60;H01L21/68;H01L21/768;H01L23/48;H01L23/485;H01L25/065 主分类号 H01L21/60
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