发明名称 UNIFORM RECESS OF A MATERIAL IN A TRENCH INDEPENDENT OF INCOMING TOPOGRAPHY
摘要 Columnar elements which extend to varying heights above a major surface of a substrate, e.g., polysilicon studs within trenches in the substrate, are recessed to a uniform depth below the major surface. The columnar elements are etched selectively with respect to a material exposed at the surface in an at least partly lateral direction so that the columnar elements are recessed to a uniform depth below the major surface at walls of the trenches.
申请公布号 US2009108306(A1) 申请公布日期 2009.04.30
申请号 US20070931112 申请日期 2007.10.31
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHENG KANGGUO;FALTERMEIER JOHNATHAN E.;LI XI
分类号 H01L29/94;H01L21/311 主分类号 H01L29/94
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