发明名称 METHOD OF MANUFACTURING NONVOLATILE MEMORY DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a nonvolatile memory device capable of preventing erroneous write to a non-select cell which shares a word line adjacent to a select line. SOLUTION: By forming a trench 102a on a semiconductor substrate between the select line and the adjacent word line and increasing a distance between the select line and the word line, an electron migration path between the select line and the word line adjacent to the select line is increased and, therefore, the problem of disturbance in which an unintentional program operation is generated in the select line and the adjacent word line is solved. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009094468(A) 申请公布日期 2009.04.30
申请号 JP20080177794 申请日期 2008.07.08
申请人 HYNIX SEMICONDUCTOR INC 发明人 YANG IN KWON
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
代理机构 代理人
主权项
地址