发明名称 DATA TRANSFER DEVICE AND SEMICONDUCTOR TEST DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a data transfer device that can improve transfer efficiency of data by reducing the overhead of system call and sufficiently utilizing the band of a data bus. SOLUTION: The data transfer device 1 comprises a CPU 11, and DMA controllers 31a-31n provided on a plurality of tester devices 12a-12n. In the CPU 11, a system control part 21 and a device driver part 22 are attained by software. The system control part 21 outputs a DMA transfer command group in which DMA transfer commands to the DMA controllers 31a-31n are gathered, and the device driver part 22 receives the DMA transfer command groups from the system control part 21 by a device node 24, and sorts the DMA transfer commands contained in the received DMA transfer command group to the tester devices 12a-12n, respectively, according to the contents thereof. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009093536(A) 申请公布日期 2009.04.30
申请号 JP20070265434 申请日期 2007.10.11
申请人 YOKOGAWA ELECTRIC CORP 发明人 MOCHIZUKI MASAYUKI
分类号 G06F13/28;G01R31/28 主分类号 G06F13/28
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