METHOD AND APPARATUS FOR ARRAY-BASED ELECTRICAL DEVICE CHARACTERIZATION

摘要

An electronic circuit to determine current-voltage characteristics of a plurality of electronic devices under test. The electronic circuit is comprised of a plurality of individual test cells, each of the plurality of test cells is configured to electrically couple to a first terminal of one of the plurality of electronic devices under test and to a first current source. A second terminal of each of the plurality of electronic devices under test couples to a second current source. The circuit employs a current-based measurement method.