发明名称 |
PRODUCTION METHOD FOR SiC SINGLE CRYSTAL, SiC SINGLE CRYSTAL WAFER AND SiC SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a production method for an SiC single crystal suitable as a substrate material for electronic and optical devices, by a solution growth method. SOLUTION: After soaking an SiC seed crystal substrate 4 having a crystal face sloping from a ä0001} face, into an SiC solution 1 prepared by dissolving carbon into a melt of an Si metal or Si-M alloy (M is at least one metal other than Si) as a solvent, the SiC single crystal is grown on the substrate by bringing at least a near place of the substrate into a supersaturation state by supercooling using a temperature gradient method with≤5°C/cm temperature gradient, or an annealing method with a cooling rate of≥0.05°C/min and≤1°C/min. Where the maximum temperature difference in temperature distribution within the face of a growth interface when growing the crystal, is at most 2°C. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2009091222(A) |
申请公布日期 |
2009.04.30 |
申请号 |
JP20070265717 |
申请日期 |
2007.10.11 |
申请人 |
SUMITOMO METAL IND LTD;MITSUBISHI ELECTRIC CORP |
发明人 |
KUSUNOKI KAZUHIKO;YASHIRO MASANARI;KAMEI KAZUTO;HATTORI AKIRA |
分类号 |
C30B29/36;C30B19/04;H01L21/205 |
主分类号 |
C30B29/36 |
代理机构 |
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地址 |
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