发明名称 DEFECT DETECTION METHOD AND DEFECT DETECTOR
摘要 PROBLEM TO BE SOLVED: To provide a defect detection method for preventing a beam of laser light from entering into an end face of a honeycomb structure and an open end of cells, and sensitively detecting a defect in the honeycomb structure. SOLUTION: In the defect detection method, a grid-like antireflection member 20 for covering one end face 12a is disposed on one end face 12a of the cylindrical honeycomb structure 12 formed with a plurality of the cells partitioned by a porous partitions. Fine particles are introduced into the honeycomb structure 12 from the other end face of the honeycomb structure 12, pass through the antireflection member 20, and are discharged from one end face 12a. After the fine particles pass through the antireflection member 20, they are irradiated with the beam of laser light 13 parallel to one end face 12a, and visualized. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009092480(A) 申请公布日期 2009.04.30
申请号 JP20070262483 申请日期 2007.10.05
申请人 NGK INSULATORS LTD 发明人 MIYASHITA KOICHI;HATANO TATSUHIKO
分类号 G01N15/08;G01M3/20 主分类号 G01N15/08
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