发明名称 Method of forming nonvolatile memory device having floating gate and related device
摘要 A method of manufacturing a non-volatile memory device is provided. The method includes forming isolation patterns defining an active region on a substrate, forming a floating gate pattern on the active region, and forming a gate line on the floating gate pattern. The floating gate pattern is self-aligned on the active region and has an impurity ion concentration that becomes relatively low as the floating gate pattern gets nearer to the active region.
申请公布号 US2009108323(A1) 申请公布日期 2009.04.30
申请号 US20080228772 申请日期 2008.08.15
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JEE JUNG-GEUN;SON HO-MIN;HYUNG YONG-WOO;HAN JAE-JONG;LIM TAEK-JIN
分类号 H01L29/788;H01L21/22;H01L21/3215 主分类号 H01L29/788
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